By Alessandro Cultrera – Electrical Metrology at INRIM: The EURAMET EMPIR project GRACE (2017-2020), aimed at drafting validated measurement protocols for the electrical characterisation of graphene, had, among its objectives, the task of providing input to the Technical Committee 113 – “Nanotechnology for electrotechnical products and systems” of…
By Lijun Yin – International Graphene Product Certification Center (IGCC): On November 13, 2021, the ”GrapChina 2021 Standardization Forum” hosted by the International Graphene Product Certification Center (IGCC) was successfully held at Shanghai University. Chairperson of the forum was Prof. Chen Chengmeng from the Shanxi…
By Lijun Yin – International Graphene Product Certification Center (IGCC): China International Graphene Innovation Conference has been successfully held for seven consecutive years, and its influence has been growing continuously. The seven conferences have attracted more than 1,200 experts in the field of new materials…
By the ISC Team: The ISC-Team congratualates Dr. Elena Taboada from das-Nano on the IEC 1906 Award 2021. The 1906 Award commemorates the funding of the electrotechnical commission – IEC which held its inaugural meeting on June 26, 1906 in London. Lord Kelvin was elected as…
By the ISC-Team: The ISC-Team congratulates Dr. Alessandro Cultrera from Istituto Nazionale di Ricerca Metrologica – INRIM on the IEC 1906 Award 2021. The 1906 Award commemorates the funding of the electrotechnical commission – IEC which held its inaugural meeting on June 26, 1906 in…
By the ISC-Team: The TC 113 Autumn Meetings, including Working Group Meetings and Plenary will be conducted online. Experts are requested to register at the IEC Meeting Registration System (MRS) by 25.10.2021 The secretariat will setup the zoom meetings and send the links to the…
IEC Abstract: IEC 62607-9-1: 2021 establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The…
IEC Abstract: IEC TS 62607-6-10:2021 establishes a standardized method to determine the electrical key control characteristic sheet resistance (Rs) for films of graphene-based materials by terahertz time domain spectroscopy (THz-TDS). In this technique, a THz pulse is sent to the graphene-based material. The transmitted or…