IEC TS 62607-6-19 "Nanomanufacturing - Key control characteristics - Part 6-19: Graphene-based material - Elemental composition: CS analyser, ONH analyser" has been published by IEC/TC 113

IEC TS 62607-6-19 “Nanomanufacturing – Key control characteristics – Part 6-19: Graphene-based material – Elemental composition: CS analyser, ONH analyser” has been published by IEC/TC 113

IEC Abstract: IEC TS 62607-6-19:2021 establishes a standardized method to determine the chemical key control characteristic elemental composition for powder consisting of graphene-based material by CS analyser and ONH analyser. The method as described in this document determines the content of carbon (C), sulfur (S),…

IEC TS 62607-6-6 "Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscoopy" has been published by IEC/TC 113

IEC TS 62607-6-6 “Nanomanufacturing – Key control characteristics – Part 6-6: Graphene – Strain uniformity: Raman spectroscoopy” has been published by IEC/TC 113

IEC Abstract: IEC TS 62607-6-6:2021 establishes a standardized method to determine the structural key control characteristic strain uniformity for single-layer graphene by Raman spectroscopy. The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure…

IEC TR 63258 "Nanotechnologies - A guideline for ellipsometry application to evaluate the thickness of nanoscale films" has been published by IEC/TC 113

IEC TR 63258 “Nanotechnologies – A guideline for ellipsometry application to evaluate the thickness of nanoscale films” has been published by IEC/TC 113

IEC Abstract: IEC TR 63258:2021 is a Technical Report focused on the practical protocol of ellipsometry to evaluate the thickness of nanoscale films. This document does not include any specification of the ellipsometers, but suggests how to minimize the data variation to improve data reproducibility.…