IEC TS 62607-6-6:2021 establishes a standardized method to determine the structural key control characteristic
- strain uniformity
for single-layer graphene by
- Raman spectroscopy.
The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic properties of the layer.
- The classification will help manufacturers to classify their material quality to provide an upper limit of the electronic performance of the characterized graphene, to decide whether or not the graphene material quality is potentially suitable for various applications.
Picture: Illustration of stress applied to the graphene lattice (With permission of RWTH Aachen University, Prof. Christoph Stampfer)
The scientific work to evaluate the measurement and analytic principles have been carried out in the FET Flagship Graphene funded by the European Commission under Horizon 2020.