IEC TR 63258 "Nanotechnologies - A guideline for ellipsometry application to evaluate the thickness of nanoscale films" has been published by IEC/TC 113

IEC TR 63258 “Nanotechnologies – A guideline for ellipsometry application to evaluate the thickness of nanoscale films” has been published by IEC/TC 113

by ISC-Team ABSTRACT: IEC TR 63258:2021 is a Technical Report focused on the practical protocol of ellipsometry to evaluate the thickness of nanoscale films. This document does not include any specification of the ellipsometers, but suggests how to minimize the data variation to improve data…

IEC TS 62607-6-14 "Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy" has been published by IEC/TC 113

IEC TS 62607-6-14 “Nanomanufacturing – Key control characteristics – Part 6-14: Graphene-based material – Defect level: Raman spectroscopy” has been published by IEC/TC 113

by ISC-Team ABSTRACT:  IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic defect level for powders consisting of graphene-based material by Raman spectroscopy. The defect level is derived by the intensity ratio of the D+D′ band and 2D band in…

Memorandum of Understanding signed between Shanghai University, ISC International Standards Consulting and IGCC International Graphene Product Certification Center at the GrapChina 2020

Memorandum of Understanding signed between Shanghai University, ISC International Standards Consulting and IGCC International Graphene Product Certification Center at the GrapChina 2020

by ISC-Team During the GrapChina 2020 held October 16 – 18, 2020 in Shanghai, China, a Memorandum of Understanding was signed by Shanghai University, ISC International Standards Consulting and IGCC International Graphene Product Certification Center regarding their future collaboration in the field of nanomaterials for…