By the ISC-Team: The TC 113 Autumn Meetings, including Working Group Meetings and Plenary will be conducted online. Experts are requested to register at the IEC Meeting Registration System (MRS) by 25.10.2021 The secretariat will setup the zoom meetings and send the links to the…
Autor: ISC Team
IEC TS 62607-9-1 “Nanomanufacturing – Key control characteristics – Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements – Magnetic force microscopy” has been published by IEC/TC 113
IEC Abstract: IEC 62607-9-1: 2021 establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The…
IEC TS 62607-6-10 “Nanomanufacturing – Key control characteristics – Part 6-10: Graphene-based material – Sheet resistance: Terahertz time-domain spectroscopy” has been published by IEC/TC 113
IEC Abstract: IEC TS 62607-6-10:2021 establishes a standardized method to determine the electrical key control characteristic sheet resistance (Rs) for films of graphene-based materials by terahertz time domain spectroscopy (THz-TDS). In this technique, a THz pulse is sent to the graphene-based material. The transmitted or…
IEC TS 62607-6-19 “Nanomanufacturing – Key control characteristics – Part 6-19: Graphene-based material – Elemental composition: CS analyser, ONH analyser” has been published by IEC/TC 113
IEC Abstract: IEC TS 62607-6-19:2021 establishes a standardized method to determine the chemical key control characteristic elemental composition for powder consisting of graphene-based material by CS analyser and ONH analyser. The method as described in this document determines the content of carbon (C), sulfur (S),…
IEC TS 62607-6-6 “Nanomanufacturing – Key control characteristics – Part 6-6: Graphene – Strain uniformity: Raman spectroscoopy” has been published by IEC/TC 113
IEC Abstract: IEC TS 62607-6-6:2021 establishes a standardized method to determine the structural key control characteristic strain uniformity for single-layer graphene by Raman spectroscopy. The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure…
World Standards Day October 14, 2021
By the ISC-Team: On October 14, 2021, the world leading standards developing organizations IEC, ISO and ITU are celebrating the World Standards Day 2021. This year they point out their contributions to achieve the UN Sustainable Development Goals (SDG) for a better world. Find out…
International Graphene Product Certification Center GmbH registered in Germany
By Chao ZHANG – International Graphene Product Certification Center (IGCC): The International Graphene Product Certification Center (IGCC), the first and most active third-party certification body in graphene domain in the world, has successfully registered International Graphene Product Certification Center GmbH in Neu-Isenburg, Germany (HRB 53881).…
The project LeTID-Norm has been successfully completed
By the ISC-Team: LeTID stands for Light and Elevated Temperature Induced Degradation of silicon-based PV cells and modules. It is a material based failure mechanism which significantly limits the life time of solar cells due to the light and temperature induced reduction of the cell…