IEC Abstract: IEC 62607-9-1: 2021 establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The…
Tag: 14. Oktober 2021
IEC TS 62607-6-10 “Nanomanufacturing – Key control characteristics – Part 6-10: Graphene-based material – Sheet resistance: Terahertz time-domain spectroscopy” has been published by IEC/TC 113
IEC Abstract: IEC TS 62607-6-10:2021 establishes a standardized method to determine the electrical key control characteristic sheet resistance (Rs) for films of graphene-based materials by terahertz time domain spectroscopy (THz-TDS). In this technique, a THz pulse is sent to the graphene-based material. The transmitted or…
IEC TS 62607-6-19 “Nanomanufacturing – Key control characteristics – Part 6-19: Graphene-based material – Elemental composition: CS analyser, ONH analyser” has been published by IEC/TC 113
IEC Abstract: IEC TS 62607-6-19:2021 establishes a standardized method to determine the chemical key control characteristic elemental composition for powder consisting of graphene-based material by CS analyser and ONH analyser. The method as described in this document determines the content of carbon (C), sulfur (S),…
IEC TS 62607-6-6 “Nanomanufacturing – Key control characteristics – Part 6-6: Graphene – Strain uniformity: Raman spectroscoopy” has been published by IEC/TC 113
IEC Abstract: IEC TS 62607-6-6:2021 establishes a standardized method to determine the structural key control characteristic strain uniformity for single-layer graphene by Raman spectroscopy. The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure…