IEC TS 62607-6-14 "Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy" has been published by IEC/TC 113

IEC TS 62607-6-14 “Nanomanufacturing – Key control characteristics – Part 6-14: Graphene-based material – Defect level: Raman spectroscopy” has been published by IEC/TC 113

by ISC-Team ABSTRACT:  IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic defect level for powders consisting of graphene-based material by Raman spectroscopy. The defect level is derived by the intensity ratio of the D+D′ band and 2D band in…